October 29, 2010 CERMETEK ADAPTS WIRELESS SENSOR NETWORK TO MONITOR UNITS-UNDER-TEST Critical Test Parameters Monitored via Cermetek Wireless Sensor Network .
Cermetek Microelectronics has successfully adapted our remote sensor monitoring capability to monitor systems under test. Sensors connected to each system in the final test phase of the assembly or refurbishing process monitor critical parameters and allow a single operator to monitor the performance of more than a dozen units-under-test.
Systems Under Test
A wireless sensor node monitors each unit-under-test. Sensors connect to the unit-under-test to monitor Critical parameters including temperature and power consumption. The wireless sensor nodes transmit the sensor data to the network hub at frequent intervals throughout the two hour test cycle. The network hub moves the sensor data to the RSVP (Remote Sensor Viewing Platform) software for storage, display, and processing.
RSVP simultaneously displays the received sensor data for up to 12 units-under-test. This allows a single technician to oversee the entire test floor.
The RSVP software includes the facility to permit the customer to set limits on the parameters being monitored. These limits define system hard failures. When RSVP detects a hard failure, it flashes the sensor display for the affected unit to signal the technician to immediately take that system off-line.
This monitoring system also fives the technician the information to identify systems showing signs of weak components which have not yet reached a hard failure. As an example, power consumption may continue to increase throughout the test period while never reaching the level of a hard failure. The technician observing this trend can pull the unit to determine the weak component of the system and avoid shipping a system which will likely fail in the upcoming weeks or months.
The Cermetek RSVP software and wireless sensor network have provided the system manufacturer with immediate benefits. The ability to immediately identify hard-failures and remove them from the test floor increases the number of systems that can be processed by the test unit. The ability to identify systems which may fail in the near future reduces the number of service calls.